PALATSE, V. G. Exploring Principal Component Analysis in Defect Prediction: A Survey. Perspectives in Communication, Embedded-systems and Signal-processing - PiCES, [S. l.], v. 4, n. 4, p. 56-63, 2020. DOI: 10.5281/zenodo.3974580. Disponível em: http://pices-journal.com/ojs/index.php/pices/article/view/247. Acesso em: 15 nov. 2024.